Pindel can detect breakpoints of large deletions, medium sized insertions, inversions, tandem duplications and other structural variants at single-based resolution from next-gen sequence data.

It uses a pattern growth approach to identify the breakpoints of these variants from paired-end short reads.


Please download the package from


If you need help or have any queries, please contact us using the details below.

Please contact Kai Ye ( )

Sanger Institute Contributors

Photo of Dr Zemin Ning

Dr Zemin Ning

Senior Scientific Manager

External Contributors

Photo of Kai Ye

Kai Ye